Effect of dielectric barrier on rectification, injection and transport properties of printed organic diodes

Journal of Physics D: Applied Physics

Volumn 44, Issue 29, 2011, Pages

  Lilja, K E ^a   Majumdar, H S ^b   Lahtonen, K ^a   Heljo, P ^a   Tuukkanen, S ^a   Joutsenoja, T ^a   Valden, M ^a   Sterbacka, R ^b   Lupo, D ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^b ÅBO AKADEMI UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER CATHODES; COPPER SURFACE; DIELECTRIC BARRIER; DIODE STRUCTURE; IMPEDANCE DATA; IMPEDANCE SPECTROSCOPY; INSULATING LAYERS; ORGANIC DIODES; ORGANIC LAYERS; RECTIFICATION RATIO; REVERSE CURRENTS; THIN INSULATING BARRIERS; XPS MEASUREMENTS;

CATHODES; DIODES; PHOTOELECTRON SPECTROSCOPY; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTOR DIODES;

EID: 79960245008     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/29/295301     Document Type: Article

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