Preparation and characterization of ultra-flat single crystal surfaces of Pd(1 1 1) and Au(1 1 1) by an in situ interference optical microscopy

Journal of Electroanalytical Chemistry

Volumn 649, Issue 1-2, 2010, Pages 257-260

  Wen, Rui ^a   Lahiri, Abhishek ^a   Alagurajan, Mukkannan ^a   Kuzume, Akiyoshi ^a   Kobayashi, Shin Ichiro ^a   Itaya, Kingo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Atomic step; Au(1 1 1); Differential interference microscopy (DIM); Pd(1 1 1)

Indexed keywords

ARGON; ATOMIC FORCE MICROSCOPY; OPTICAL MICROSCOPY; PALLADIUM; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS;

ATOMIC LAYER; ATOMIC STEP; AU(1 1 1); DIFFERENTIAL INTERFERENCE CONTRAST MICROSCOPES; DIFFERENTIAL INTERFERENCE MICROSCOPY (DIM); ELECTROCHEMICAL REACTIONS; ELECTROLYTE SOLUTIONS; FLAT TERRACES; IN-SITU; IN-SITU METHODS; LASER CONFOCAL MICROSCOPE; PD(1 1 1);

SINGLE CRYSTAL SURFACES;

EID: 79960221639     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2010.06.009     Document Type: Article

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