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Volumn 6, Issue 7, 2011, Pages 399-400
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Scanning probes: Cold-atom microscope shapes up
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Author keywords
[No Author keywords available]
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Indexed keywords
NANOTECHNOLOGY;
COLD ATOMS;
SCANNING PROBES;
NANOSTRUCTURED MATERIALS;
CARBON NANOTUBE;
ATOM;
ATOMIC FORCE MICROSCOPE;
MAGNETIC FIELD;
MICROCHIP ANALYSIS;
MICROSCOPE;
NOTE;
PHYSICAL PHENOMENA;
PRIORITY JOURNAL;
ROOM TEMPERATURE;
SCANNING PROBE MICROSCOPE;
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EID: 79960075610
PISSN: 17483387
EISSN: 17483395
Source Type: Journal
DOI: 10.1038/nnano.2011.107 Document Type: Note |
Times cited : (5)
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References (6)
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