A LA-ICP-MS sulphide calibration standard based on a chalcogenide glass

Mineralogical Magazine

Volumn 75, Issue 2, 2011, Pages 279-287

  Ding, Lihua ^a   Yang, Guang ^a,f   Xia, Fang ^b,c   Lenehan, Claire E ^d   Qian, Gujie ^c,e   McFadden, Aoife ^c   Brugger, Joë L ^b,c   Zhang, Xianghua ^f   Chen, Guorong ^a   Pring, Allan ^b,c  

^a East China University of Science and Technology   (China)

^b UNIVERSITY OF ADELAIDE   (Australia)

^c SOUTH AUSTRALIAN MUSEUM   (Australia)

^d FLINDERS UNIVERSITY   (Australia)

^e UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

^f INSTITUT DES SCIENCES CHIMIQUES DE RENNES   (France)

Author keywords

Ge Sb S chalcogenide glasses; LA ICP MS; sulphide calibration standard; trace element analysis

Indexed keywords

ANTIMONY COMPOUNDS; CALIBRATION; CHALCOGENIDES; GERMANIUM COMPOUNDS; GLASS; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; LASER ABLATION; MASS SPECTROMETERS; OPTICAL EMISSION SPECTROSCOPY; PYRITES; SULFUR COMPOUNDS;

ACCURATE MEASUREMENT; CALIBRATION STANDARD; CHALCOGENIDE GLASS; GE-SB-S CHALCOGENIDE GLASS; LASER-ABLATION INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY; RELATIVE STANDARDS DEVIATIONS; SULPHIDE CALIBRATION STANDARD; TRACE ELEMENT ANALYSIS; TRACE ELEMENTS CONCENTRATION; TRACES ELEMENTS;

TRACE ELEMENTS;

ACCURACY ASSESSMENT; CALIBRATION; CONCENTRATION (COMPOSITION); ELECTRON PROBE ANALYSIS; GLASS; HOMOGENEITY; INDUCTIVELY COUPLED PLASMA METHOD; STANDARD (REFERENCE); SULFIDE; TRACE ELEMENT;

EID: 79960008842     PISSN: 0026461X     EISSN: 14718022     Source Type: Journal    
DOI: 10.1180/minmag.2011.075.2.279     Document Type: Article

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