Hydrogen selective thin palladium-copper composite membranes on alumina supports

Journal of Membrane Science

Volumn 378, Issue 1-2, 2011, Pages 179-185

  Lim, Hankwon ^a   Oyama, S Ted ^a,b  

^a State University   (United States)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Hydrogen; Intermediate layer; Pd Cu; Scanning electron microscopy; Sievert's law; Ultrathin

Indexed keywords

INTERMEDIATE LAYER; PD-CU; SCANNING ELECTRONS; SIEVERT'S LAW; ULTRA-THIN;

DEFECTS; ELECTROLESS PLATING; HYDROGEN; MEMBRANES; NANOCOMPOSITE FILMS; PORE SIZE; SCANNING ELECTRON MICROSCOPY; WAVEGUIDES;

COMPOSITE MEMBRANES;

ALUMINUM OXIDE; COPPER; HYDROGEN; PALLADIUM;

ARTICLE; COMPOSITE MATERIAL; COMPOSITE MEMBRANE; CONTROLLED STUDY; DIFFUSION; HYDROGEN BOND; MEMBRANE; PARTICLE SIZE; PRESSURE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 79959995566     PISSN: 03767388     EISSN: 18733123     Source Type: Journal    
DOI: 10.1016/j.memsci.2011.04.054     Document Type: Article

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