Control of the electronic properties and resistive switching in the new series of mott insulators GaTa4Se8-yTey (≤ y ≤ 6.5)

Chemistry of Materials

Volumn 23, Issue 10, 2011, Pages 2611-2618

  Guiot, V ^a   Janod, E ^a   Corraze, B ^a   Cario, L ^a  

^a UNIVERSITÉ DE NANTES   (France)

Author keywords

Chalcogenide; Eesistive switching; Electronic properties; Lacunar spinel; Mott insulator

Indexed keywords

CHALCOGENIDES; ELECTRONIC PROPERTIES; ENERGY GAP; GALLIUM COMPOUNDS; PRESSURE EFFECTS; SELENIUM; TANTALUM COMPOUNDS; TELLURIUM;

BAND STRUCTURE CALCULATION; CHEMICAL PRESSURE EFFECTS; CRYSTALLOGRAPHIC SITES; ELECTRIC-PULSE-INDUCED RESISTIVE SWITCHING; ELECTRONIC REPULSION; LACUNAR SPINEL; TETRAHEDRAL CLUSTERS; TRANSPORT MEASUREMENTS;

MOTT INSULATORS;

EID: 79959984936     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm200266n     Document Type: Article

References (22)

1. Imada, M.; Fujimori, A.; Tokura, Y. Rev. Mod. Phys. 1998, 70, 1039.
2. Honig, J. M.; Spalek, J. Chem. Mater. 1998, 10, 2910-2929.
3. McWhan, D. B.; Remeika, J. P. Phys. Rev. B 1970, 2, 3734-3750.
4. Lupi, S.; Baldassarre, L.; Mansart, B.; Perucchi, A.; Barinov, A.; Dudin, P.; Papalazarou, E.; Rodolakis, F.; Rueff, J.-P.; Itié, J.-P.; Ravy, S.; Nicoletti, D.; Postorino, P.; Hansmann, P.; Parragh, N.; Toschi, A.; Saha-Dasgupta, T.; Andersen, O. K.; Sangiovanni, G.; Held, K.; Marsi, M. Nat. Commun. 2010, 1, 105.
5. Yao, X.; Honig, J. M.; Hogan, T.; Kannewurf, C.; Spalek, J. Phys. Rev. B 1996, 54, 17469-17475.
6. Ben Yaich, H.; Jegaden, J. C.; Potel, M.; Sergent, M.; Rastogi, A. K.; Tournier, R. J. Less-Common Met. 1984, 102, 9.
7. Johrendt, D. Z. Anorg. Allg. Chem. 1998, 624, 952-958.
8. Dorolti, E.; Cario, L.; Corraze, B.; Janod, E.; Vaju, C.; Koo, H. J.; Kan, E.; Whangbo, M. H. J. Am. Chem. Soc. 2010, 132, 5704-5710.
9. Vaju, C.; Martial, J.; Janod, E.; Corraze, B.; Fernandez, V.; Cario, L. Chem. Mater. 2008, 20, 2382-2387.
10. Abd-Elmeguid, M. M.; Ni, B.; Khomskii, D. I.; Pocha, R.; Johrendt, D.; Wang, X.; Syassen, K. Phys. Rev. Lett. 2004, 93, 126403.
11. Pocha, R.; Johrendt, D.; Ni, B. F.; Abd-Elmeguid, M. M. J. Am. Chem. Soc. 2005, 127, 8732-8740.
12. Cario, L.; Vaju, C.; Corraze, B.; Guiot, V.; Janod, E. Adv. Mater. 2010, 22, 5193-5197.
13. Dubost, V.; Cren, T.; Vaju, C.; Cario, L.; Corraze, B.; Janod, E.; Debontridder, F.; Roditchev, D. Adv. Funct. Mater. 2009, 19, 2800-2804.
14. Souchier, E.; Cario, L.; Corraze, B.; Moreau, P.; Mazoyer, P.; Estounés, C.; Retoux, R.; Janod, E.; Besland, M.-P. Phys. Status Solidi RRL 2011, 5, 53-55.
15. Vaju, C.; Cario, L.; Corraze, B.; Janod, E.; Dubost, V.; Cren, T.; Roditchev, D.; Braithwaite, D.; Chauvet, O. Adv. Mater. 2008, 20, 2760.
16. Vaju, C.; Cario, L.; Corraze, B.; Janod, E.; Dubost, V.; Cren, T.; Roditchev, D.; Braithwaite, D.; Chauvet, O. Microelectron. Eng. 2008, 85, 2430.
17. Petricek, V.; Dusek, M.; Palatinus, L. JANA 2006; Academy of Science of Cseck Republic: Praha, 2006.
18. Kraus, W.; Nolze, G. PowderCell for Windows, 2.4 ed.; 2000.
19. Blaha, P.; Schwarz, K.; Madsen, G.; Kvasnicka, D.; Luitz, J. WIEN2K; 2001.
20. Zaanen, J.; Sawatzky, G. A.; Allen, J. W. Phys. Rev. Lett. 1985, 55, 418.
21. Taphuoc, V., to be published.
22. Georges, A.; Kotliar, G.; Krauth, W.; Rozenberg, M. J. Rev. Mod. Phys. 1996, 68, 13.