Universal scaling of the figure of merit of plasmonic sensors

ACS Nano

Volumn 5, Issue 6, 2011, Pages 5151-5157

  Offermans, Peter ^a   Schaafsma, Martijn C ^b   Rodriguez, Said R K ^b   Zhang, Yichen ^b   Crego Calama, Mercedes ^a   Brongersma, Sywert H ^a   Gómez Rivas, Jaime ^b,c  

^a HOLST CENTRE   (Netherlands)

^b FOM INSTITUTE AMOLF   (Netherlands)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

figure of merit; nanoparticle; plasmon; resonance; scaling; sensing

Indexed keywords

BROAD SPECTRAL; COUPLED RESONANCE; DIFFRACTIVE COUPLING; FANO RESONANCES; FIGURE-OF-MERIT; FREQUENCY DIFFERENCES; LOCALIZED SURFACE PLASMON RESONANCE; NARROW-LINE WIDTH; PLASMONIC NANOPARTICLE; PLASMONIC SENSORS; SCALING; SENSING; SENSITIVE DETECTION; SURFACE LATTICE; UNIVERSAL SCALING;

LIGHT REFRACTION; NANOPARTICLES; REFRACTIVE INDEX; REFRACTOMETERS; SENSORS; SURFACE PLASMON RESONANCE;

PLASMONS;

GOLD; METAL NANOPARTICLE; NANOMATERIAL;

ARTICLE; CHEMISTRY; ELECTROMAGNETIC FIELD; GENETIC PROCEDURES; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; OPTICS; OSCILLOMETRY; REFRACTOMETRY; SCANNING ELECTRON MICROSCOPY; STATISTICAL MODEL; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

BIOSENSING TECHNIQUES; ELECTROMAGNETIC FIELDS; GOLD; MATERIALS TESTING; METAL NANOPARTICLES; MICROSCOPY, ELECTRON, SCANNING; MODELS, STATISTICAL; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICS AND PHOTONICS; OSCILLOMETRY; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 79959785204     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn201227b     Document Type: Article

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