Structural origins of relaxor behavior in a 0.96 (Bi1/2 Na 1/2) TiO3 -0.04 BaTiO3 single crystal under electric field

Applied Physics Letters

Volumn 98, Issue 25, 2011, Pages

  Daniels, John E ^a   Jo, Wook ^b   Rödel, Jürgen ^b   Rytz, Daniel ^c   Donner, Wolfgang ^b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c FEE GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSE SCATTERING; DIFFUSE X-RAY SCATTERING; FIELD DEPENDENCE; NANOMETER LENGTH SCALE; NANOSCALE STRUCTURE; RELAXOR BEHAVIOR; ROOM TEMPERATURE; STRUCTURAL ORIGIN; TIO;

BARIUM COMPOUNDS; ELECTRIC FIELDS; PERMITTIVITY MEASUREMENT; SCATTERING; SODIUM; X RAY SCATTERING;

SINGLE CRYSTALS;

EID: 79959620925     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3602316     Document Type: Article

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