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Volumn 98, Issue 25, 2011, Pages

Determination of the subcell photovoltage in multijunction solar cells via voltage-dependent capacitance analysis

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY ANALYSIS; ALGAINP; EXPERIMENTAL VERIFICATION; MULTI JUNCTION SOLAR CELLS; OPEN CIRCUIT CONDITIONS; PHOTO-VOLTAGE; QUASI-FERMI LEVEL SPLITTING;

EID: 79959606846     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3601468     Document Type: Article
Times cited : (15)

References (12)
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  • 7
    • 27944434341 scopus 로고    scopus 로고
    • Thirty-first IEEE Photovoltaic Specialists Conference, 3-7 Jan., Florida, USA, 10.1109/PVSC.2005.1488189
    • C. Baur, M. Meusel, F. Dimroth, A. W. Bett, M. Nell, G. Strobl, S. Taylor, and C. Signorini, Thirty-first IEEE Photovoltaic Specialists Conference, 3-7 Jan. 2005, Florida, USA, p. 548. 10.1109/PVSC.2005.1488189
    • (2005) , pp. 548
    • Baur, C.1    Meusel, M.2    Dimroth, F.3    Bett, A.W.4    Nell, M.5    Strobl, G.6    Taylor, S.7    Signorini, C.8
  • 8
    • 41349100461 scopus 로고    scopus 로고
    • Internal voltages in GaIn/PGaInAs/Ge multijunction solar cells determined by electroluminescence measurements
    • DOI 10.1063/1.2903101
    • T. Kirchartz, U. Rau, M. Hermle, A. W. Bett, A. Helbig, and J. H. Werner, Appl. Phys. Lett. 0003-6951 92, 123502 (2008). 10.1063/1.2903101 (Pubitemid 351451685)
    • (2008) Applied Physics Letters , vol.92 , Issue.12 , pp. 123502
    • Kirchartz, T.1    Rau, U.2    Hermle, M.3    Bett, A.W.4    Helbig, A.5    Werner, J.H.6
  • 9
    • 33748304175 scopus 로고    scopus 로고
    • Characterization of monolithic III-V multi-junction solar cells-challenges and application
    • DOI 10.1016/j.solmat.2006.06.025, PII S0927024806002479
    • M. Meusel, C. Baur, G. Siefer, F. Dimroth, A. W. Bett, and W. Warta, Sol. Energy Mater. Sol. Cells 0927-0248 90, 3268 (2006). 10.1016/j.solmat.2006.06. 025 (Pubitemid 44332109)
    • (2006) Solar Energy Materials and Solar Cells , vol.90 , Issue.18-19 , pp. 3268-3275
    • Meusel, M.1    Baur, C.2    Siefer, G.3    Dimroth, F.4    Bett, A.W.5    Warta, W.6
  • 12
    • 33244474412 scopus 로고    scopus 로고
    • Application of junction capacitance measurements to the characterization of solar cells
    • DOI 10.1109/TED.2006.870846
    • F. Recart and A. Cuevas, IEEE Trans. Electron Devices 0018-9383 53, 442 (2006). 10.1109/TED.2006.870846 (Pubitemid 43280596)
    • (2006) IEEE Transactions on Electron Devices , vol.53 , Issue.3 , pp. 442-448
    • Recart, F.1    Cuevas, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.