Correlated barrier hopping in ZnO nanorods

Journal of Applied Physics

Volumn 109, Issue 11, 2011, Pages

  Soosen, Samuel M ^a   Chandran, Anoop ^a   Koshy, Jiji ^a   George, K C ^a  

^a ST BERCHMANS COLLEGE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTION; CHARGED DEFECTS; CONDUCTION MECHANISM; CORRELATED BARRIER HOPPING; CORRELATED BARRIER HOPPING MODELS; EXPERIMENTAL DATA; FREQUENCY RANGES; HOPPING DISTANCES; PHYSICAL PARAMETERS; PL SPECTRA; THEORETICAL RESULT; ZNO NANOROD;

DEFECT DENSITY; DEFECTS; SURFACE DEFECTS; ZINC OXIDE;

NANORODS;

EID: 79959441154     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3594709     Document Type: Article

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