Studies of wall painting fragments from Kaiping Diaolou by SEM/EDX, micro Raman and FT-IR spectroscopy

Microchemical Journal

Volumn 96, Issue 2, 2010, Pages 330-336

  Zeng, Q G ^a   Zhang, G X ^a   Leung, C W ^b   Zuo, J ^c  

^a Wu Yi University   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Micro FT IR; Micro Raman; Pigment analysis; SEM EDX

Indexed keywords

EID: 79959377799     PISSN: 0026265X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microc.2010.05.013     Document Type: Article

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