Measurement of wurtzite ZnO/rutile TiO2 heterojunction band offsets by x-ray photoelectron spectroscopy

Applied Physics A: Materials Science and Processing

Volumn 103, Issue 4, 2011, Pages 1099-1103

  Wang, Jun ^a   Liu, Xiang Lin ^a   Yang, An Li ^a   Zheng, Gao Lin ^a   Yang, Shao Yan ^a   Wei, Hong Yuan ^a   Zhu, Qin Sheng ^a   Wang, Zhan Guo ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND ALIGNMENTS; BAND GAP ENERGY; BAND OFFSETS; CONDUCTION BAND OFFSET; METAL-ORGANIC; TIO; VALENCE-BAND OFFSET; WURTZITES; ZNO; ZNO/TIO;

HETEROJUNCTIONS; ORGANIC CHEMICALS; OXIDE MINERALS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; TITANIUM DIOXIDE; ZINC OXIDE; ZINC SULFIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79959309667     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-010-6048-7     Document Type: Article

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