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Volumn 50, Issue 13, 2011, Pages 1941-1944

Sample preparation method for glass welding by ultrashort laser pulses yields higher seam strength

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; GLASS; JOINING; LASER PULSES; WELDING;

EID: 79958806571     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.001941     Document Type: Article
Times cited : (51)

References (8)
  • 4
    • 33750717185 scopus 로고    scopus 로고
    • Laser micro-welding of transparent materials by a localized heat accumulation effect using a femtosecond fiber laser at 1558 nm
    • DOI 10.1364/OE.14.010460
    • T. Tamaki, W. Watanabe, and K. Itoh, "Laser micro-welding of transparent materials by a localized heat accumulation effect using a femtosecond fiber laser at 1558 nm," Opt. Express 14, 10460-10468 (2006). (Pubitemid 44706135)
    • (2006) Optics Express , vol.14 , Issue.22 , pp. 10460-10468
    • Tamaki, T.1    Watanabe, W.2    Itoh, K.3
  • 6
    • 0035126697 scopus 로고    scopus 로고
    • Optical contact and van der Waals interactions: The role of the surface topography in determining the bonding strength of thick glass plates
    • DOI 10.1088/1464-4258/3/1/314
    • V. Greco, F. Marchesini, and G. Molesini, "Optical contact and van der Waals interactions: the role of the surface topography in determining the bonding strength of thick glass plates," J. Opt. A: Pure Appl. Opt. 3, 85-88 (2001). (Pubitemid 32189538)
    • (2001) Journal of Optics A: Pure and Applied Optics , vol.3 , Issue.1 , pp. 85-88
    • Greco, V.1    Marchesini, F.2    Molesini, G.3
  • 7
    • 84893893328 scopus 로고    scopus 로고
    • http://labaccessories.mellesgriot.com/pdfs/Cleaning-Methods .pdf.
  • 8
    • 48949116064 scopus 로고    scopus 로고
    • Modeling the formation of spontaneous wafer direct bonding under low temperature
    • Z. Tang, T. Shi, G. Liao, and S. Liu, "Modeling the formation of spontaneous wafer direct bonding under low temperature," Microelectron. Eng. 85, 1754-1757 (2008).
    • (2008) Microelectron. Eng. , vol.85 , pp. 1754-1757
    • Tang, Z.1    Shi, T.2    Liao, G.3    Liu, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.