Photon interactions for electron microscopy applications

EPJ Applied Physics

Volumn 54, Issue 3, 2011, Pages

  Howie, A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL SOLUTIONS; DINGER EQUATION; NEAR FIELDS; PHOTON INTERACTIONS; PHOTON-ELECTRON INTERACTIONS; REFRACTION EFFECTS;

PHOTONS;

EID: 79958785734     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2010100353     Document Type: Article

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