Multiple kernel learning SVM and statistical validation for facial landmark detection

2011 IEEE International Conference on Automatic Face and Gesture Recognition and Workshops, FG 2011

Volumn , Issue , 2011, Pages 265-271

  Rapp, Vincent ^a   Senechal, Thibaud ^a   Bailly, Kevin ^b   Prevost, Lionel ^c  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b INSTITUT TELECOM   (France)

^c UNIVERSITY OF THE WEST INDIES   (Trinidad and Tobago)

Author keywords

[No Author keywords available]

Indexed keywords

FACE IMAGES; FACIAL EXPRESSIONS; FACIAL LANDMARK; FACIAL LANDMARK DETECTION; GLOBAL INFORMATIONS; HIGH RESOLUTION; LIGHTING CONDITIONS; LOW RESOLUTION; MULTI-RESOLUTIONS; MULTIPLE KERNEL LEARNING; MULTIPLE KERNELS; POINT DETECTION; POINT DETECTORS; PRIOR KNOWLEDGE; ROBUST DETECTION; STATE OF THE ART; STATISTICAL VALIDATION; SYSTEM ROBUSTNESS;

FACE RECOGNITION; GESTURE RECOGNITION;

DETECTORS;

EID: 79958743692     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FG.2011.5771409     Document Type: Conference Paper

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