High thermal stability of phosphor-converted white light-emitting diodes employing Ce:YAG-doped glass

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 17, Issue 3, 2011, Pages 741-746

  Wang, Jimmy ^a   Tsai, Chun Chin ^a   Cheng, Wei Chih ^b   Chen, Ming Hung ^a   Chung, Cheng Hsun ^a   Cheng, Wood Hi ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b NATIONAL KAOHSIUNG UNIVERSITY OF APPLIED SCIENCES   (Taiwan)

Author keywords

Aging test; Ce:YAG doped glass (CeYDG); Ce:YAG doped silicone (CeYDS); high power LED modules; phosphor converted white light emitting diodes (PC WLEDs); reliability

Indexed keywords

AGING TESTS; CURRENT PROCESSING; DOPED GLASS; DOPING CONCENTRATION; FABRICATION PROCESS; GLASS COMPOSITIONS; HIGH THERMAL STABILITY; HIGH-POWER LED MODULES; PEAK EMISSIONS; RELIABILITY TEST; WHITE LIGHT EMITTING DIODES;

DIODES; GLASS; LIGHT EMISSION; PHOSPHORS; REFINING; RELIABILITY; SILICONES; TESTING; THERMODYNAMIC STABILITY;

LIGHT EMITTING DIODES;

EID: 79958289392     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2010.2096459     Document Type: Article

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