Characterization of metrological grade analog-to-digital converters using a programmable Josephson voltage standard

IEEE Transactions on Instrumentation and Measurement

Volumn 60, Issue 7, 2011, Pages 2172-2177

  Overney, Frédéric ^a   Rüfenacht, Alain ^a   Braun, Jean Pierre ^a   Jeanneret, Blaise ^a   Wright, Paul S ^b  

^a Swiss Federal Office of Metrology   (Switzerland)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Analog digital conversion; delta sigma modulation; Josephson junctions; metrology; noise measurement

Indexed keywords

ALLAN DEVIATION; ANALOG TO DIGITAL CONVERTERS; ANALOG-DIGITAL CONVERSION; DIGITIZERS; DIRECT CURRENT; HIGH RESOLUTION; INTEGRAL NONLINEARITY; JOSEPHSON JUNCTIONS; JOSEPHSON VOLTAGE STANDARDS; NOISE MEASUREMENTS; NOISE PERFORMANCE; PROGRAMMABLE JOSEPHSON VOLTAGE STANDARD; REFERENCE SIGNALS; TEST BENCHES; TRIANGULAR WAVEFORM;

CHARACTERIZATION; DELTA SIGMA MODULATION; ELECTRIC CONVERTERS; JOSEPHSON JUNCTION DEVICES; MODULATORS; VOLTAGE MEASUREMENT;

ANALOG TO DIGITAL CONVERSION;

EID: 79958264396     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2011.2113950     Document Type: Article

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