Development of x-ray optics for advanced research light sources

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8078, Issue , 2011, Pages

  Störmer, Michael ^a   Siewert, Frank ^b   Gaudin, Jerome ^c  

^a INSTITUTE OF MATERIALS RESEARCH   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c EUROPEAN XFEL GMBH   (Germany)

Author keywords

amorphous carbon coatings; Free electron laser; magnetron sputtering; multilayers; reflective elements; total reflection mirrors; x ray mirrors; X ray optics; XFEL

Indexed keywords

AMORPHOUS CARBON COATING; REFLECTIVE ELEMENTS; TOTAL REFLECTION MIRRORS; X RAY MIRRORS; XFEL;

AMORPHOUS CARBON; AMORPHOUS FILMS; BORON CARBIDE; COATINGS; ELECTROMAGNETIC WAVE REFLECTION; ELECTRONS; FREE ELECTRON LASERS; INSTRUMENTS; LIGHT; LIGHT SOURCES; MIRRORS; MULTILAYERS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; X RAY OPTICS;

X RAYS;

EID: 79958192454     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.887530     Document Type: Conference Paper

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