Modeling of light scattering properties from surface profile in thin-film solar cells by Fourier transform techniques

Thin Solid Films

Volumn 519, Issue 19, 2011, Pages 6538-6543

  Bittkau, K ^a   Schulte, M ^a   Klein, M ^a   Beckers, T ^a   Carius, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Fourier transform; Haze; Light scattering; Thin film solar cell

Indexed keywords

HAZE; INPUT DATAS; LIGHT SCATTERING MODEL; NANO METER RANGE; PHOTOVOLTAICS; SCATTERING PROPERTY; SILICON INTERFACE; SURFACE PROFILES; TEXTURED SURFACE; THIN FILM SILICON; THIN-FILM SOLAR CELLS;

AMORPHOUS FILMS; AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; LIGHT SCATTERING; REFRACTION; REFRACTIVE INDEX; SCATTERING; SURFACE PROPERTIES; ZINC;

FOURIER TRANSFORMS;

EID: 79958189844     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.04.122     Document Type: Article

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