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Thin Solid Films

Volumn 519, Issue 18, 2011, Pages 6135-6139

Influence of annealing on humidity response of RF sputtered nanocrystalline MgFe2O4 thin films

(6) Kotnala, R K a Shah, Jyoti a Mathpal, Mohan C a Verma, K C b Singh, Sandeep a Lovkush, a

a NATIONAL PHYSICAL LABORATORY (India)

b HIMACHAL PRADESH UNIVERSITY (India)

Author keywords

Annealing temperature; Humidity sensing; MgFe2O4 thin film; RF sputtering

Indexed keywords

ALUMINA SUBSTRATES; ANNEALING TEMPERATURES; ATOMIC FORCE MICROSCOPE IMAGES; CRYSTALLINE PHASE; HUMIDITY HYSTERESIS; HUMIDITY SENSING; MGFE2O4 THIN FILM; NANOCRYSTALLINES; RADIO FREQUENCIES; RESPONSE MEASUREMENT; RESPONSE/RECOVERY TIME; RF SPUTTERING; SCANNING ELECTRON MICROSCOPE;

ANNEALING; ATOMIC FORCE MICROSCOPY; FREQUENCY RESPONSE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

THIN FILMS;

EID: 79958138371 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.03.120 Document Type: Article

Times cited : (22)

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