SCOPUS 정보 검색 플랫폼

Volumn 15, Issue 6, 2011, Pages 1109-1113

Dependence of RuO 2-capacitive properties on preparation conditions

(4) Pocrifka, Leonardo A a Freitas, Renato G a Rosario, Adriane V a Pereira, Ernesto C a

a FEDERAL UNIVERSITY OF SÃO CARLOS (Brazil)

Author keywords

Electrochemical capacitors; Electrochemical properties; Pechini method; Rietveld analysis; Ruthenium oxide; Sol gel route

Indexed keywords

ELECTROCHEMICAL CAPACITOR; PECHINI METHOD; RIETVELD; RUTHENIUM OXIDE; SOL-GEL ROUTE;

CALCINATION; DIFFRACTION; ELECTROCHEMICAL PROPERTIES; OXIDE FILMS; RIETVELD ANALYSIS; RUTHENIUM; RUTHENIUM ALLOYS; RUTHENIUM COMPOUNDS; SOL-GEL PROCESS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

FILM PREPARATION;

EID: 79958126809 PISSN: 14328488 EISSN: None Source Type: Journal
DOI: 10.1007/s10008-010-1167-9 Document Type: Article

Times cited : (9)

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