Synthetic zircon doped with hafnium and rare earth elements: A reference material for in situ hafnium isotope analysis

Chemical Geology

Volumn 286, Issue 1-2, 2011, Pages 32-47

  Fisher, Christopher M ^a   Hanchar, John M ^a   Samson, Scott D ^b   Dhuime, Bruno ^c,d   Blichert Toft, Janne ^e   Vervoort, Jeffery D ^f   Lam, Rebecca ^a  

^a MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

^b SYRACUSE UNIVERSITY   (United States)

^c UNIVERSITY OF BRISTOL   (United Kingdom)

^d UNIVERSITY OF ST ANDREWS   (United Kingdom)

^e UNIVERSITÉ DE LYON   (France)

^f WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

Hafnium isotopes; Isobaric interference; Laser ablation; Reference material; Synthetic zircon; Ytterbium

Indexed keywords

HAFNIUM ISOTOPES; HF ISOTOPE; HF SOLUTIONS; IN-SITU; IN-SITU ANALYSIS; IN-SITU METHODS; ISOBARIC INTERFERENCES; ISOTOPIC ANALYSIS; ISOTOPIC COMPOSITION; ISOTOPIC MEASUREMENT; ISOTOPIC REFERENCE MATERIALS; LABORATORY PROTOCOLS; MASS BIAS CORRECTION; MC-ICP-MS; MULTI-COLLECTOR; NATURAL ZIRCON; REFERENCE MATERIAL; SIGNAL INTENSITIES; SYNTHETIC ZIRCON; SYNTHETIC ZIRCON CRYSTALS;

ABLATION; CRYSTALS; ELECTROMAGNETIC INDUCTION; GADOLINIUM; HAFNIUM; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ISOTOPES; LASER ABLATION; LASER APPLICATIONS; MASS SPECTROMETERS; MONITORING; RARE EARTHS; TERBIUM; YTTERBIUM;

ZIRCON;

INDUCTIVELY COUPLED PLASMA METHOD; ISOTOPIC ANALYSIS; ISOTOPIC COMPOSITION; LASER METHOD; RARE EARTH ELEMENT; ZIRCON;

EID: 79958010206     PISSN: 00092541     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemgeo.2011.04.013     Document Type: Article

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