Characterization of flux-grown Trace-element-doped titanite using the high-mass-resolution ion microprobe (SHRIMP-RG)

Canadian Mineralogist

Volumn 47, Issue 4, 2009, Pages 813-831

  Mazdab, Frank K ^a,b  

^a U S GEOLOGICAL SURVEY   (United States)

^b University of Arizona   (United States)

Author keywords

"sphene"; Flux growth synthesis; Ion microprobe (SHRIMP RG); Titanite; Trace elements

Indexed keywords

''SPHENE''; AMBIENT PRESSURES; ANALYTICAL CHALLENGE; ANALYTICAL TECHNIQUES; AUTHIGENIC; BACKSCATTERED ELECTRONS; CHEMICAL HOMOGENEITY; DOPANT-FREE; HIGH TEMPERATURE; IN-SITU; ION MICROPROBE; ION MICROPROBE (SHRIMP-RG); LARGE SIZES; MATRIX; MICRO BEAMS; MICRO-PROBES; MOLECULAR INTERFERENCE; MOLTEN SODIUM; POLYATOMIC INTERFERENCES; STARTING MATERIALS; SYNTHETIC CRYSTALS; TIO; TITANITE;

ACTINIDES; ALKALINITY; BARIUM; CALCIUM; CHROMIUM; CRYSTALS; DIMERS; DOPING (ADDITIVES); GERMANIUM; HAFNIUM; ION MICROSCOPES; IONS; ISOTOPES; LEAD; LIGHT METALS; METALLIC GLASS; NIOBIUM; RARE EARTH ELEMENTS; SCANDIUM; SECONDARY ION MASS SPECTROMETRY; SILICATES; STRONTIUM; TANTALUM; TIN; TRACE ANALYSIS; ZIRCONIUM;

TRACE ELEMENTS;

AUTHIGENIC MINERAL; BACKSCATTER; COMPARATIVE STUDY; ELECTRON PROBE ANALYSIS; IGNEOUS ROCK; IN SITU MEASUREMENT; ION MICROPROBE; LIME; MASS SPECTROMETRY; METASOMATIC ROCK; SILICON; TITANITE;

DECAPODA (CRUSTACEA);

EID: 70350139699     PISSN: 00084476     EISSN: None     Source Type: Journal    
DOI: 10.3749/canmin.47.4.813     Document Type: Article

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