Conductance of single cobalt chalcogenide cluster junctions

Journal of the American Chemical Society

Volumn 133, Issue 22, 2011, Pages 8455-8457

  Boardman, Brycelyn M ^a   Widawsky, Jonathan R ^b   Park, Young S ^a   Schenck, Christine L ^a   Venkataraman, Latha ^b   Steigerwald, Michael L ^a   Nuckolls, Colin ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BREAK JUNCTIONS; CONDUCTANCE PROPERTIES; DENSITY FUNCTIONAL THEORY CALCULATIONS; ELECTRICAL CONDUCTION; ELECTRICAL PROPERTY; HOMO-LUMO GAPS; OXIDATION POTENTIALS; QUANTUM DOT DEVICES; SCANNING TUNNELING MICROSCOPES; VOLTAMMETRY MEASUREMENTS;

COBALT; CYCLIC VOLTAMMETRY; DENSITY FUNCTIONAL THEORY; ELECTRIC PROPERTIES; PHASE CHANGE MEMORY; PROBES; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS;

COBALT COMPOUNDS;

CHALCOGEN; COBALT; QUANTUM DOT; SELENIUM; SULFUR;

ARTICLE; CALCULATION; CHEMICAL COMPOSITION; CONDUCTANCE; CYCLIC POTENTIOMETRY; DENSITY FUNCTIONAL THEORY; ELECTRICAL CONDUCTIVITY PARAMETERS; ELECTRODE; LIGAND BINDING; MEASUREMENT; MICROSCOPE; MOLECULAR PROBE; OXIDATION REDUCTION POTENTIAL; SCANNING TUNNELING MICROSCOPE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR;

EID: 79958003960     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja201334s     Document Type: Article

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