Structural and electronic properties of ZnWO4(010) cleaved surface

Crystal Growth and Design

Volumn 11, Issue 6, 2011, Pages 2479-2484

  Atuchin, Victor V ^a   Galashov, Evgeny N ^b   Khyzhun, Oleg Yu ^c   Kozhukhov, Anton S ^d,e   Pokrovsky, Lel D ^a   Shlegel, Vladimir N ^b  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^b NIKOLAEV INSTITUTE OF INORGANIC CHEMISTRY   (Russian Federation)

^c FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^d INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^e NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDINGS; CLEAVED SURFACES; CORE-LEVEL SPECTRA; CRYSTALLOGRAPHIC PROPERTIES; CZOCHRALSKI TECHNIQUE; FORMAL VALENCES; HIGH QUALITY; KIKUCHI LINES; LOW-THERMAL GRADIENTS; OXYGEN ATOM; PARTIAL TRANSFORMATION; TUNGSTEN IONS; VALENCE STATE; XPS; XPS MEASUREMENTS; ZINC ATOMS; ZNO; ZNWO;

CHEMICAL BONDS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; METAL IONS; PHOTOELECTRON SPECTROSCOPY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TUNGSTEN; TUNGSTEN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE;

SURFACE STRUCTURE;

EID: 79957971726     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg200265p     Document Type: Article

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