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Volumn , Issue , 2011, Pages
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Structural study of Ag-Ge-S solid electrolyte glass system for resistive radiation sensing
a a a b c c |
Author keywords
chalcogenide glasses; radiation induced effects; radiation sensor; Raman spectroscopy; resistance change; solid electrolyte glasses
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Indexed keywords
ACTIVE LAYER;
CHALCOGENIDE GLASS;
ELECTRICAL MEASUREMENT;
ELECTRICAL RESISTANCES;
ELEMENTAL ANALYSIS;
ENERGY DISPERSIVE X-RAY SPECTROSCOPY;
GLASS SYSTEMS;
LOW COSTS;
NEW APPLICATIONS;
NON-VOLATILE MEMORIES;
RADIATION SENSOR;
RADIATION SENSORS;
RADIATION-INDUCED;
RADIATION-INDUCED EFFECTS;
RADIATION-SENSING;
RAMAN SCATTERING SPECTROSCOPY;
RESISTANCE CHANGE;
STRUCTURAL CHANGE;
STRUCTURAL DETAILS;
STRUCTURAL STUDIES;
TEST DEVICE;
ELECTRIC VARIABLES MEASUREMENT;
ELECTRON DEVICES;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ENERGY DISPERSIVE SPECTROSCOPY;
GERMANIUM;
GLASS;
MICROELECTRONICS;
PHASE CHANGE MEMORY;
RADIATION EFFECTS;
RADIATION SHIELDING;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SENSORS;
SILVER;
SOLID ELECTROLYTES;
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EID: 79957929310
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/WMED.2011.5767271 Document Type: Conference Paper |
Times cited : (4)
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References (10)
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