Optimal sample size allocation for multi-level stress testing with weibull regression under type-II censoring

Statistics

Volumn 45, Issue 3, 2011, Pages 257-279

  Ka, C Y ^a   Chan, P S ^a   Ng, H K T ^b   Balakrishnan, N ^c  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b SOUTHERN METHODIST UNIVERSITY   (United States)

^c MCMASTER UNIVERSITY   (Canada)

Author keywords

Accelerated life testing; Extreme value distribution; Lifetime data; Maximum likelihood estimators; Survival analysis; Weibull distribution

Indexed keywords

EID: 79957892957     PISSN: 02331888     EISSN: 10294910     Source Type: Journal    
DOI: 10.1080/02331880903546290     Document Type: Article

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