Erratum: Microstructural and electrical properties of Ce 0.9Gd0.1O1.95 thin film electrolyte in solid oxide fuel cells (Journal of Materials Research (2011) 26:7 (854) DOI: 10.1557/jmr.2010.72);Microstructural and electrical properties of Ce0.9Gd 0.1O1.95 thin-film electrolyte in solid-oxide fuel cells

Journal of Materials Research

Volumn 26, Issue 7, 2011, Pages 854-859

  Cho, Sungmee ^a   Yoon, Jongsik ^a   Kim, Jung Hyun ^b   Zhang, Xinghang ^a   Manthiram, Arumugam ^b   Wang, Haiyan ^a  

^a Texas AandM University   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Electrical Properties; Physical Vapor Deposition (PVD); Thin Film

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM OXIDE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC PROPERTIES; FILM PREPARATION; GADOLINIUM COMPOUNDS; GRAIN SIZE AND SHAPE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LASER ABLATION; MAGNESIA; OXIDE FILMS; PHYSICAL VAPOR DEPOSITION; PULSED LASER DEPOSITION; PULSED LASERS; SINGLE CRYSTALS; SOLID OXIDE FUEL CELLS (SOFC); SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; YTTRIA STABILIZED ZIRCONIA; YTTRIUM OXIDE; ZIRCONIA;

ELECTRICAL MEASUREMENT; MEASUREMENT TEMPERATURES; MICRO-STRUCTURAL PROPERTIES; OXYGEN PARTIAL PRESSURE; SOLID OXIDE FUEL CELLS (SOFCS); SUBSTRATE TEMPERATURE; THIN FILM ELECTROLYTES; YTTRIA-STABILIZED ZIRCONIAS (YSZ);

SOLID ELECTROLYTES;

EID: 79957839614     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2011.172     Document Type: Erratum

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