The non-linear fitting method to study the semiconductor properties of passive films of INCONEL alloy G3

Journal of Electroanalytical Chemistry

Volumn 658, Issue 1-2, 2011, Pages 52-56

  Jiang, Rui Jing ^a   Chen, Chang Feng ^a,b   Zheng, Shu Qi ^a,b   Cui, Li Shan ^a,b  

^a CHINA UNIVERSITY OF PETROLEUM   (China)

^b CHINA UNIVERSITY OF PETROLEUM   (China)

Author keywords

Carrier density; Double layer; Mott Schottky plots; Nickel base alloy; Passive film

Indexed keywords

ALLOYS; CAPACITANCE; CAPACITANCE MEASUREMENT; CARRIER CONCENTRATION; ELECTRIC IMPEDANCE; OXIDE FILMS; POLARIZATION; SEMICONDUCTING FILMS;

CARRIER DENSITY; DOUBLE LAYERS; MOTT-SCHOTTKY PLOTS; NICKEL BASE ALLOY; PASSIVE FILM;

CERIUM ALLOYS;

EID: 79957827155     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2011.04.014     Document Type: Article

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