The non-linear fitting method to analyze the measured M-S plots of bipolar passive films

Electrochimica Acta

Volumn 55, Issue 7, 2010, Pages 2498-2504

  Jiang, Ruijing ^a   Chen, Changfeng ^a   Zheng, Shuqi ^a  

^a CHINA UNIVERSITY OF PETROLEUM   (China)

Author keywords

Bipolar; Mott Schottky plot; Non linear fitting; Passive film

Indexed keywords

ANTI-CORROSION; APPLIED POTENTIALS; FITTING RESULTS; HIGH PARTIAL PRESSURE; HIGH TEMPERATURE; MOTT-SCHOTTKY; MOTT-SCHOTTKY PLOTS; NICKEL BASE ALLOYS; NONLINEAR FITTING; PASSIVE FILMS; SERIES CONNECTIONS; SPACE CHARGES;

CAPACITANCE; ELECTRONIC PROPERTIES;

ELECTRIC IMPEDANCE;

EID: 75949120833     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2009.11.093     Document Type: Article

References (30)

1. Schottky W. Z. Physik. 113 (1939) 367
2. Schottky W. Z. Physik. 118 (1942) 539
3. Schottky W., and Spenke E. Wiss. Veroffentl. Siemens-Werken 18 (1939) 3
4. Mott N.F. Proc. R. Soc. (Lond.) A171 (1939) 27
5. Morrison S.R. Electrochemistry at Semiconductor and Oxidized Electrodes (1980), Plenum Press, New York
6. Braun C.M., Fujishima A., Honda K., and Nadjo L. Surf. Sci. 176 (1986) 367
7. Dean M.H., and Stimming U. Corros. Sci. 29 (1989) 199
8. Lee E.J., and Pyun S.I. J. Appl. Electrochem. 22 (1992) 156
9. Hakiki N.E., Boudin S., Rondot B., and Belo M.D.C. Corros. Sci. 37 (1995) 1809
10. Hakiki N.E., and Belo M.D.C. J. Electrochem. Soc. 143 (1996) 3088
11. Hakiki N.E., Belo M.D.C., Simões A.M.P., and Ferreira M.G.S. J. Electrochem. Soc. 145 (1998) 3821
12. Ferreira M.G.S., Hakiki N.E., Goodlet G., Faty S., Simões A.M.P., and Belo M.D.C. Electrochim. Acta 46 (2001) 3767
13. Ries L.A.S., Belo M.D.C., Ferreira M.G.S., and Muller I.L. Corros. Sci. 50 (2008) 968
14. Tsuchiya H., Fujimoto S., Chihara O., and Shibata T. Electrochim. Acta 47 (2002) 4357
15. Tsuchiya H., Fujimoto S., and Shibata T. J. Electrochem. Soc. 151 (2004) B39
16. Fujimoto S., and Tsuchiya H. Corros. Sci 49 (2007) 195
17. Macdonald D.D., and Urquidi-Macdonald M. J. Electrochem. Soc. 137 (1990) 2395
18. Sato N. Corrosion 45 (1989) 354
19. Sato N. Corros. Sci. 31 (1990) 1
20. Garrett C.G.B., and Brattain W.H. Phys. Rev. 99 (1955) 376
21. Balkanski M., and Wallis R.F. Semiconductor Physics and Applications (2000), Oxford University Press, Oxford p. 307
22. Grove A.S. Physics and Technology of Semiconductor Devices (1967), Wiley and Sons, New York p. 153
23. Li S.S. Semiconductor Physical Electronics. 2nd ed. (2006), Springer Press, New York p. 346
24. Qian Y.H., and Xu Z.Z. Physics of Semiconductor (1999), Higher Education Press, Beijing p. 294
25. Ye L.X. Semiconductor Physics. 2nd ed. (2007), Higher Education Press, Beijing p. 307
26. Carlsson P., Uosaki K., Holmström B., and Kita H. J. Electrochem. Soc. 136 (1989) 524
27. Carmezim M.J., Simões A.M., Figueiredo M.O., and Belo M.D.C. Corros. Sci. 44 (2002) 451
28. Balkanski M., and Wallis R.F. Semiconductor Physics and Applications (2000), Oxford University Press, Oxford p. 319
29. Montemor M.F., Ferreira M.G.S., Hakiki N.E., and Belo M.D.C. Corros Sci. 42 (2000) 1635
30. Fujimoto S., and Tsuchiya H. Corros Sci. 49 (2007) 195