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Volumn 65, Issue 15-16, 2011, Pages 2470-2472
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Formation and characterization of zinc oxide nanowires grown on hexagonal-prism microstructures
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Author keywords
Chemical vapour deposition; Luminescence; Microstructure; Optical materials and properties; Semiconductors
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Indexed keywords
CHEMICAL VAPOUR DEPOSITION;
ENERGY DISPERSIVE X-RAY;
OPTICAL MATERIALS AND PROPERTIES;
PHOTOLUMINESCENCE LINES;
PHOTOLUMINESCENCE PROPERTIES;
ROOM TEMPERATURE;
SEM IMAGE;
UV EMISSIONS;
WURTZITE PHASE;
XRD ANALYSIS;
ZINC OXIDE NANOWIRES;
ZNO;
CHEMICAL VAPOR DEPOSITION;
MATERIALS PROPERTIES;
NANOWIRES;
OXYGEN VACANCIES;
PHOTOLUMINESCENCE;
PRISMS;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ZINC;
ZINC OXIDE;
ZINC SULFIDE;
MICROSTRUCTURE;
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EID: 79957637626
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matlet.2011.05.027 Document Type: Article |
Times cited : (5)
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References (25)
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