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Journal of Electron Spectroscopy and Related Phenomena

Volumn 184, Issue 3-6, 2011, Pages 257-260

Orientation of n-alkane in thin films on graphite (0 0 0 1) studied using C K-NEXAFS

(6) Endo, Osamu a Ozaki, Hiroyuki a Sumii, Ryouhei b Amemiya, Kenta b Nakamura, Masashi c Kosugi, Nobuhiro d

a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY (Japan)

b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK (Japan)

c CHIBA UNIVERSITY (Japan)

d INSTITUTE FOR MOLECULAR SCIENCE (Japan)

Author keywords

Alkane; Graphite; NEXAFS STM

Indexed keywords

ABSORPTION EDGES; ALKANE; C-H BOND; CARBON K-EDGE; LOWER ENERGIES; N-ALKANES; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES; NEXAFS STM; NORMAL INCIDENCE; ULTRAHIGH VACUUM CONDITIONS;

ABSORPTION; CARBON FILMS; FILM PREPARATION; MULTILAYER FILMS; PARAFFINS; RESONANCE;

GRAPHITE;

EID: 79957606598 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2010.12.035 Document Type: Article

Times cited : (10)

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