Frequency dependence of dielectric properties and electrical conductivity of Cu/nano-SnO2 thick film/Cu arrangement

Current Applied Physics

Volumn 11, Issue 4, 2011, Pages 1071-1076

  Chenari, H Mahmoudi ^a   Golzan, M M ^a   Sedghi, H ^a   Hassanzadeh, A ^a   Talebian, M ^a  

^a URMIA UNIVERSITY   (Iran)

Author keywords

Dielectric properties; Electrical conductivity; SnO2 nanoparticles; Thick film

Indexed keywords

AC ELECTRICAL CONDUCTIVITY; COLE-COLE DIAGRAMS; COMPLEX IMPEDANCE SPECTROSCOPY; DIELECTRIC CONSTANTS; ELECTRIC MODULUS; ELECTRICAL CONDUCTIVITY; FREQUENCY DEPENDENCE; FREQUENCY INTERVALS; IMAGINARY PARTS; IMPEDANCE DATA; LOSS TANGENT; SNO2 NANOPARTICLES;

DIELECTRIC LOSSES; POLYMER BLENDS; THICK FILMS;

ELECTRIC CONDUCTIVITY;

EID: 79957537240     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2011.01.038     Document Type: Article

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