Nanocrystalline In2O3-SnO2 thick films for low-temperature hydrogen sulfide detection

Ceramics International

Volumn 37, Issue 6, 2011, Pages 1889-1894

  Liu, Huan ^a   Wu, Shuxi ^a   Gong, Shuping ^a   Zhao, Jun ^a   Liu, Jianqiao ^a   Zhou, Dongxiang ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

H2S; Nanocrystalline; SnO2; Thick film

Indexed keywords

H2S; INTERFACIAL BARRIERS; LOW CONCENTRATIONS; LOW TEMPERATURES; MAJOR FACTORS; NANOCRYSTALLINES; OPERATING TEMPERATURE; POROUS MICROSTRUCTURE; REPRODUCIBILITIES; ROOM TEMPERATURE; SENSING PERFORMANCE; SNO2; STRUCTURAL MODIFICATIONS;

CRYSTALLITE SIZE; HYDROGEN SULFIDE; INDIUM; SENSORS;

THICK FILMS;

EID: 79957520376     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2011.02.005     Document Type: Article

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