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Optics Letters

Volumn 36, Issue 10, 2011, Pages 1869-1871

Near-field measurement of amplitude and phase in silicon waveguides with liquid cladding

(5) Ayache, Maurice a Nezhad, Maziar P a Zamek, Steve a Abashin, Maxim a,b Fainman, Yeshaiahu a

a UNIVERSITY OF CALIFORNIA (United States)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AIR-TO-WATER; EFFECTIVE REFRACTIVE INDEX; INDEX SHIFT; LIQUID CLADDING; MEASURED DATA; NEAR-FIELD MEASUREMENT; ON CHIPS; REFRACTIVE INDEX PROFILES; SILICON WAVEGUIDE; SOLID DIELECTRIC;

DIELECTRIC MATERIALS; FOURIER ANALYSIS; LIGHT REFRACTION; LIQUIDS; PHOTONIC DEVICES; REFRACTIVE INDEX; REFRACTOMETERS; WAVEGUIDES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 79956319508 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.36.001869 Document Type: Article

Times cited : (6)

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