Simulation of silicon thin-film solar cells for oblique incident waves

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8065, Issue , 2011, Pages

  Jandl, Christine ^a   Hertel, Kai ^a   Pflaum, Christoph ^a   Stiebig, Helmut ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b Malibu GmbH and Co KG   (Germany)

Author keywords

AFM scan; oblique incident waves; thin film solar cells

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; CELL LAYERS; CIRCULARLY POLARIZED LIGHT; COMPUTATIONAL REQUIREMENTS; FINITE INTEGRATION TECHNIQUE; HIGH PERFORMANCE COMPUTERS; MAXWELL'S EQUATIONS; NANOTEXTURED; NUMERICAL CALCULATION; OBLIQUE INCIDENT WAVE; OBLIQUE INCIDENT WAVES; SCAN DATA; SIMULATION TOOL; THIN-FILM SOLAR CELLS; TRANSPARENT CONDUCTIVE OXIDES;

ATOMIC FORCE MICROSCOPY; BEHAVIORAL RESEARCH; COMPUTER SIMULATION; EFFICIENCY; FINITE DIFFERENCE TIME DOMAIN METHOD; INDUSTRIAL APPLICATIONS; LIGHT REFLECTION; MANUFACTURE; MAXWELL EQUATIONS; NUMERICAL METHODS; OPTICAL PROPERTIES; SOLAR CELLS; SUSTAINABLE DEVELOPMENT; TECHNICAL PRESENTATIONS;

TIME DOMAIN ANALYSIS;

EID: 79956199191     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.882860     Document Type: Conference Paper

References (9)

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