Goodness-of-fit tests for gee models with longitudinal ordinal data using a global odds ratio

ICIC Express Letters

Volumn 5, Issue 6, 2011, Pages 1821-1826

  Lin, Kuo Chin ^a   Chen, Yi Ju ^b   Liu, Chin Yun ^a  

^a TAINAN UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b TAMKANG UNIVERSITY   (Taiwan)

Author keywords

GEE; Global odds ratio; Goodness of fit; Longitudinal ordinal data; Residual analysis

Indexed keywords

GEE; GLOBAL ODDS RATIO; GOODNESS OF FIT; LONGITUDINAL ORDINAL DATA; RESIDUAL ANALYSIS;

DATA REDUCTION;

STATISTICAL TESTS;

EID: 79956132211     PISSN: 1881803X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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