Na0.5K0.5NbO3 thin films for voltage controlled acoustoelectric device applications

Applied Physics Letters

Volumn 80, Issue 17, 2002, Pages 3171-3173

  Cho, Choong Rae ^a   Katardjiev, Ilia ^a   Grishin, Michael ^b   Grishin, Alex ^b  

^a UPPSALA UNIVERSITY   (Sweden)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTOELECTRIC DEVICES; C-AXIS ORIENTED FILM; C-V HYSTERESIS; CAPACITANCE VOLTAGE MEASUREMENTS; CRYSTALLINITIES; DIELECTRIC PERMITTIVITIES; INTER-DIGITAL CAPACITORS; LOW DIELECTRIC LOSS; LOW-FREQUENCY DISPERSIONS; POLARIZATION REVERSALS; QUARTZ SUBSTRATE; RADIO FREQUENCIES; SCAN DATA; SINGLE CRYSTAL QUARTZ; TUNABILITIES; VOLTAGE TUNABILITY; VOLTAGE-CONTROLLED; VOLTAGE-TUNABLE;

DIELECTRIC DEVICES; DIELECTRIC LOSSES; PEROVSKITE; QUARTZ; SINGLE CRYSTALS; SODIUM; THIN FILMS; X RAY DIFFRACTION;

NIOBIUM OXIDE;

EID: 79956060614     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1473689     Document Type: Article

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