Hysteresis of the cantilever shift in ultrasonic force microscopy

Applied Physics Letters

Volumn 80, Issue 13, 2002, Pages 2386-2388

  Inagaki, K ^a   Matsuda, O ^a   Wright, O B ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM THIN FILMS; ULTRASONIC AMPLITUDE; ULTRASONIC FORCE MICROSCOPY; WORK OF ADHESION;

ADHESION; HYSTERESIS; NANOCANTILEVERS;

ULTRASONIC TESTING;

EID: 79956041710     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1463212     Document Type: Article

References (13)

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10. In Ref. 6, the JKRS equations quoted contain a misprint.
11. av) due to the feedback has a negligible influence here, and is ignored.
12. -2. (The theoretical curve of Fig. 3 is unchanged by this.)
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