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Volumn 80, Issue 16, 2002, Pages 2854-2856
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Generation of micrometer-scale discharge in a supercritical fluid environment
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL POINTS;
IONIZED STATE;
MICROMETER-SCALE;
PASCHEN'S LAW;
PLASMA STATE;
VERY LOW VOLTAGE;
CARBON DIOXIDE;
EFFLUENT TREATMENT;
IONIZATION OF GASES;
MICROMETERS;
SUPERCRITICAL FLUIDS;
ELECTRIC DISCHARGES;
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EID: 79956018335
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1470695 Document Type: Article |
Times cited : (100)
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References (19)
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