Carrier-enhanced ferromagnetism in Ge1-xMnxTe

Applied Physics Letters

Volumn 80, Issue 6, 2002, Pages 1013-1015

  Fukuma, Y ^a   Asada, H ^a   Arifuku, M ^a   Koyanagi, T ^a  

^a YAMAGUCHI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FIELD; DILUTED MAGNETIC SEMICONDUCTORS; FERROMAGNETIC ORDERS; TEMPERATURE INCREASE;

ELECTRIC RESISTANCE; FERROMAGNETISM; GERMANIUM; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MANGANESE; SATURATION MAGNETIZATION;

CARRIER CONCENTRATION;

EID: 79956002641     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1445477     Document Type: Article

References (22)

1. T. Story, R. R. Galazka, R. B. Frankel, and P. A. Wolff, Phys. Rev. Lett. 56, 777 (1986). prl PRLTAO 0031-9007
2. S. Koshihara, A. Oiwa, M. Hirasawa, S. Katsumoto, Y. Iye, C. Urano, H. Takagi, and H. Munekata, Phys. Rev. Lett. 78, 4617 (1997). prl PRLTAO 0031-9007
3. A. Haury, A. Wasiela, A. Arnoult, J. Cibert, S. Tataenko, T. Dietl, and Y. Merle d'Aubigne, Phys. Rev. Lett. 79, 511 (1997). prl PRLTAO 0031-9007
4. D. D. Awschalom, M. R. Freeman, N. Samarth, H. Luo, and J. K. Furdyna, Phys. Rev. Lett. 66, 1212 (1991). prl PRLTAO 0031-9007
5. H. Ohno, D. Chiba, F. Matsukura, T. Omiya, E. Abe, T. Dietl, Y. Ohno, and K. Ohtani, Nature (London) 408, 944 (2000). nat NATUAS 0028-0836
6. G. A. Prinz, Science 282, 1660 (1998). sci SCIEAS 0036-8075
7. H. Ohno, Science 281, 951 (1998). sci SCIEAS 0036-8075
8. G. A. Medvedkin, T. Ishibashi, T. Nishi, K. Hayata, Y. Hasegawa, and K. Sato, Jpn. J. Appl. Phys., Part 2 39, L949 (2000). jjc JAPLD8 0021-4922
9. K. Ueda, H. Tabata, and T. Kawai, Appl. Phys. Lett. 79, 988 (2001). apl APPLAB 0003-6951
10. Y. Matsumoto, M. Murakami, T. Shono, T. Hasegawa, T. Fukumura, M. Kawasaki, P. Ahmet, T. Chikyow, S. Koshihara, and H. Koinuma, Science 291, 854 (2001). sci SCIEAS 0036-8075
11. M. Linnarsson, E. Janzen, B. Monemar, M. Kleverman, and A. Thilderkvist, Phys. Rev. B 55, 6938 (1997). prb PRBMDO 0163-1829
12. Y. Fukuma, T. Murakami, H. Asada, and T. Koyanagi, Physica E (Amsterdam) 10, 273 (2001). 2by PELNFM 1386-9477
13. R. W. Cochrane, M. Plischke, and J. O. Strom-olsen, Phys. Rev. B 9, 3013 (1974). prq PLRBAQ 0556-2805
14. M. Inoue, H. Yagi, T. Tatsukawa, and Y. Kaku, J. Phys. Soc. Jpn. 45, 1610 (1978). jup JUPSAU 0031-9015
15. C. M. Hurd, The Hall Effect and Its Application, edited by C. L. Chien and C. R. Westgate (Plenum, New York, 1980), p. 43.
16. H. Ohno, F. Matsukura, T. Omiya, and N. Akiba, J. Appl. Phys. 85, 4277 (1999). jap JAPIAU 0021-8979
17. E. Burstein, Phys. Rev. 93, 632 (1954). phr PHRVAO 0031-899X
18. R. Tsu, W. E. Howard, and L. Esaki, Phys. Rev. 172, 779 (1968). phr PHRVAO 0031-899X
19. H. Ohno, H. Munekata, T. Penney, S. von Molnar, and L. L. Chang, Phys. Rev. Lett. 68, 2664 (1992). prl PRLTAO 0031-9007
20. A. Oiwa, S. Katsumoto, A. Endo, M. Hirasawa, Y. Iye, H. Ohno, F. Matsukura, A. Shen, and Y. Sugawara, Solid State Commun. 103, 209 (1997). ssc SSCOA4 0038-1098
21. T. Story, G. Karczewski, L. Swierkowski, and R. R. Galazka, Phys. Rev. B 42, 10477 (1990). prb PRBMDO 0163-1829
22. R. W. Cohrane, M. Plischke, and J. O. Strom-olsen, Phys. Rev. B 9, 3013 (1974). prq PLRBAQ 0556-2805