Degradation of the dielectric permittivity of a strongly oriented Ba 0.25Sr0.75TiO3 layer by replacing a SrRuO 3 electrode with an Ag one

Applied Physics Letters

Volumn 80, Issue 24, 2002, Pages 4603-4605

  Boikov, Yu A ^a   Claeson, T ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC LENGTH; CURIE POINTS; CURIE-WEISS BEHAVIORS; DIELECTRIC PERMITTIVITIES; ELECTRODE MATERIAL; INTERFACE LAYER; REAL PART; SERIES CAPACITANCE; TIO;

BARIUM; FERROELECTRIC FILMS; FERROELECTRICITY; INTERFACES (MATERIALS);

PERMITTIVITY;

EID: 79956000364     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1485318     Document Type: Article

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