Simple method to diagnose the performance of electroabsorption modulators on InP using optical low-coherence reflectometry

Applied Physics Letters

Volumn 81, Issue 9, 2002, Pages 1552-1554

  Rao, E V K ^a   Gottesman, Y ^a   Provost, J G ^b  

^a UNIV PARIS SUD   (France)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; INP; INP SUBSTRATES; MODULATION DEPTH; OPTICAL LOW-COHERENCE REFLECTOMETRY; OPTIMAL OPERATION; PROBE LIGHT; REVERSE BIAS; SIMPLE METHOD; TRANSITION REGIONS;

LIGHT ABSORPTION; MODULATORS; REFLECTION; REFLECTOMETERS;

ELECTROABSORPTION MODULATORS;

EID: 79955992936     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1503170     Document Type: Article

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