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Applied Physics Letters

Volumn 80, Issue 24, 2002, Pages 4549-4551

Electroreflectance of the AlGaN/GaN heterostructure and two-dimensional electron gas

(4) Kurtz, S R a Allerman, A A a Koleske, D D a Peake, G M a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN; ALGAN/GAN HETEROSTRUCTURES; APPLIED ELECTRIC FIELD; ELECTROREFLECTANCE; ELECTROREFLECTANCE TECHNIQUES; FRANZ-KELDYSH OSCILLATIONS; SPECTRAL FEATURE;

ASSOCIATED GAS; ELECTRIC FIELDS; ELECTRONIC PROPERTIES; ELECTRONS; FERMI LEVEL; FIELD EFFECT TRANSISTORS; GALLIUM NITRIDE; HETEROJUNCTIONS; PHASE INTERFACES; TWO DIMENSIONAL;

TWO DIMENSIONAL ELECTRON GAS;

EID: 79955990676 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1487447 Document Type: Article

Times cited : (30)

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