-
2
-
-
6044263674
-
-
Huang, X. C.; Zhang, J. P.; Chen, X. M. J. Am. Chem. Soc. 2004, 126, 4130-4133.
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 4130-4133
-
-
Huang, X.C.1
Zhang, J.P.2
Chen, X.M.3
-
3
-
-
0037119748
-
-
Moorthy, J. N.; Natarajan, R.; Venugopalan, P. Angew. Chem. Int. Ed. 2002, 41, 3417-3421.
-
(2002)
Angew. Chem. Int. Ed.
, vol.41
, pp. 3417-3421
-
-
Moorthy, J.N.1
Natarajan, R.2
Venugopalan, P.3
-
4
-
-
0034283379
-
-
Custelcean, R.; Afloroaei, C.; Vlassa, M.; Polverejan, M. Angew. Chem. Int. Ed. 2000, 39, 3094-3099.
-
(2000)
Angew. Chem. Int. Ed.
, vol.39
, pp. 3094-3099
-
-
Custelcean, R.1
Afloroaei, C.2
Vlassa, M.3
Polverejan, M.4
-
5
-
-
0033553131
-
-
Blanton, W. B.; Gordon-Wylie, S. W.; Clark, G. R.; Jordon, K. K.; Wood, J. T.; Geiser, U.; Collins, T. J. J. Am. Chem. Soc. 1999, 121, 3551-3556.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 3551-3556
-
-
Blanton, W.B.1
Gordon-Wylie, S.W.2
Clark, G.R.3
Jordon, K.K.4
Wood, J.T.5
Geiser, U.6
Collins, T.J.7
-
6
-
-
0034822657
-
-
Atwood, J. T.; Barbour, L. J.; Ness, T. J.; Ratson, C. L.; Ratson, P. L. J. Am. Chem. Soc. 2001, 123, 7192-7194.
-
(2001)
J. Am. Chem. Soc.
, vol.123
, pp. 7192-7194
-
-
Atwood, J.T.1
Barbour, L.J.2
Ness, T.J.3
Ratson, C.L.4
Ratson, P.L.5
-
7
-
-
0032543688
-
-
Barbour, L. J.; Orr, W. G.; Atwood, J. L. Nature 1998, 393, 671-673.
-
(1998)
Nature
, vol.393
, pp. 671-673
-
-
Barbour, L.J.1
Orr, W.G.2
Atwood, J.L.3
-
8
-
-
2542569909
-
-
Infantes, L.; Chisholm, J.; Motherwell, S. CrystEngComm. 2003, 5, 480-483.
-
(2003)
Cryst Eng Comm.
, vol.5
, pp. 480-483
-
-
Infantes, L.1
Chisholm, J.2
Motherwell, S.3
-
9
-
-
0345708163
-
-
Cheruzel, L. E.; Pometun, M. S.; Cecil, M. R.; Mashuta, M. S.; Wittebort, R. J.; Buchanan, R. M. Angew. Chem. Int. Ed. 2003, 42, 5452-5453.
-
(2003)
Angew. Chem. Int. Ed.
, vol.42
, pp. 5452-5453
-
-
Cheruzel, L.E.1
Pometun, M.S.2
Cecil, M.R.3
Mashuta, M.S.4
Wittebort, R.J.5
Buchanan, R.M.6
-
11
-
-
79955894335
-
-
Siemens, SAINT and SHELXTL. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens. SAINT and SHELXTL. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA 1994.
-
-
-
-
12
-
-
79955914638
-
-
Siemens. SMART. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens. SMART. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA 1996.
-
-
-
|