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Volumn 51, Issue 5, 2011, Pages
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Edge density characterization in the RFX-mod experiment using the ultrafast reflectometry technique
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Author keywords
[No Author keywords available]
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Indexed keywords
CUT-OFF;
DENSITY FLUCTUATION;
EDGE DENSITIES;
FREQUENCY SWEEP;
HIGH-TIME RESOLUTION;
KA BAND;
MAGNETIC TOPOLOGIES;
MICROWAVE REFLECTOMETERS;
RADIAL DISTANCE;
REFLECTOMETRY TECHNIQUE;
REVERSED FIELD PINCH;
SYSTEMATIC STUDY;
ULTRA-FAST;
EXPERIMENTS;
REFLECTOMETERS;
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EID: 79955828351
PISSN: 00295515
EISSN: 17414326
Source Type: Journal
DOI: 10.1088/0029-5515/51/5/053016 Document Type: Article |
Times cited : (16)
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References (35)
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