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Volumn , Issue , 2011, Pages 836-843

SOI-based integrated circuits for high-temperature power electronics applications

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS APPLICATIONS; EXTREME TEMPERATURES; FET SWITCHES; GATE DRIVERS; GROWING DEMAND; HIGH TEMPERATURE; HIGH-TEMPERATURE ELECTRONICS; HIGH-TEMPERATURE POWER; HIGH-VOLTAGES; HYBRID ELECTRIC VEHICLE; LIQUID COOLING; POWER ELECTRONICS MODULES; POWER FETS; POWER-TO-WEIGHT RATIOS; TRACTION DRIVE;

EID: 79955781089     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2011.5744692     Document Type: Conference Paper
Times cited : (43)

References (22)
  • 11
    • 17444432891 scopus 로고    scopus 로고
    • A self-boost charge pump topology for a gate drive high-side power supply
    • March
    • S. Park and T. M. Jahns, "A self-boost charge pump topology for a gate drive high-side power supply," IEEE Transactions on Power Electronics, vol. 20, no. 2, March 2005, pp. 300-307.
    • (2005) IEEE Transactions on Power Electronics , vol.20 , Issue.2 , pp. 300-307
    • Park, S.1    Jahns, T.M.2
  • 19
    • 79955768574 scopus 로고    scopus 로고
    • An under-voltage lockout of hysteretic threshold of zero temperature coefficients
    • Dec
    • Z. Fanglan, F. Quanyuan, and G. Kunlin, "An under-voltage lockout of hysteretic threshold of zero temperature coefficients," Microwave Conference Proceedings, vol. 2, no. 3, pp. 4-7, Dec 2005.
    • (2005) Microwave Conference Proceedings , vol.2 , Issue.3 , pp. 4-7
    • Fanglan, Z.1    Quanyuan, F.2    Kunlin, G.3
  • 21
    • 0029270842 scopus 로고
    • A discussion on IGBT short-circuit behavior and fault protection schemes
    • R.S. Chokhawala, J. Catt, L. Kiraly, "A discussion on IGBT short-circuit behavior and fault protection schemes," IEEE Transactions on Industry Applications, vol. 31, Issue. 2, 1995, pp. 256-263.
    • (1995) IEEE Transactions on Industry Applications , vol.31 , Issue.2 , pp. 256-263
    • Chokhawala, R.S.1    Catt, J.2    Kiraly, L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.