Built in Self Test (BIST) Survey - An industry snapshot of HVM component BIST usage at board and system test

Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium

Volumn , Issue , 2010, Pages

  Conroy, Zoë ^a   Li, Hui ^b   Balangue, Jun ^b  

^a CISCO SYSTEMS   (United States)

^b AGILENT TECHNOLOGIES   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPONENT TECHNOLOGIES; INTERNATIONAL ELECTRONICS MANUFACTURING INITIATIVE (INEMI); SYSTEM TEST; TEST COVERAGE; TEST TIME;

INDUSTRIAL ELECTRONICS; MANUFACTURE; SURVEYS;

TESTING;

EID: 79955773306     PISSN: 10898190     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEMT.2010.5746723     Document Type: Conference Paper

References (11)

1. Geiger, P. and Butkovich, S., "Boundary-Scan Adoption - An Industry Snapshot with Emphasis on the Semiconductor Industry", Proc IEEE International Test Conference, Austin, Tx, Nov. 2009.
2. iNEMI 2009 Roadmap http://www.inemi.org/cms/xlPrivate/roadmap/2009-RM. html.
3. iNEMI BIST Project http://www.inemi.org/cms/projects/test/BIST.html.
4. IEEE P1687 http://grouper.ieee.org/groups/1687/.
5. IEEE 1149.7 http://grouper.ieee.org/groups/1149/7/.
6. IEEE P1581 http://grouper.ieee.org/groups/1581/.
7. SJTAG http://www.sjtag.org/
8. IEEE 1149.1 http://grouper.ieee.org/groups/1149/1/.
9. IEEE 1149.6 http://grouper.ieee.org/groups/1149/6/.
10. IEEE 1500 http://grouper.ieee.org/groups/1500/.
11. IEEE P1149.8.1 http://grouper.ieee.org/groups/1149/atoggle/.