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Volumn , Issue , 2011, Pages 326-327

A 1V printed organic DRAM cell based on ion-gel gated transistors with a sub-10nW-per-cell refresh power

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; INTEGRATED CIRCUIT MANUFACTURE; TEMPERATURE;

EID: 79955733957     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2011.5746339     Document Type: Conference Paper
Times cited : (20)

References (4)
  • 1
    • 33846249503 scopus 로고    scopus 로고
    • An Organic FET SRAM with Back Gate to Increase Static Noise Margin and Its Application to Braille Sheet Display
    • Jan.
    • M. Takamiya, T. Sekitani, Y. Kato, et al., "An Organic FET SRAM With Back Gate to Increase Static Noise Margin and Its Application to Braille Sheet Display", IEEE J. Solid-State Circuits, vol. 42, no. 1, pp. 93-100, Jan. 2007.
    • (2007) IEEE J. Solid-State Circuits , vol.42 , Issue.1 , pp. 93-100
    • Takamiya, M.1    Sekitani, T.2    Kato, Y.3
  • 2
    • 70349295883 scopus 로고    scopus 로고
    • Organic CMOS Circuits for RFID Applications
    • Feb.
    • R. Blache, J. Krumm, and W. Fix, "Organic CMOS Circuits for RFID Applications", ISSCC Dig. Tech. Papers, pp. 208-109, Feb. 2009.
    • (2009) ISSCC Dig. Tech. Papers , pp. 208-1109
    • Blache, R.1    Krumm, J.2    Fix, W.3
  • 3
    • 77249168725 scopus 로고    scopus 로고
    • Printed Sub-2 V Gel-Electrolyte-Gated Polymer Transistors and Circuits
    • Feb.
    • Y. Xia, W. Zhang, M. Ha, et al., "Printed Sub-2 V Gel-Electrolyte-Gated Polymer Transistors and Circuits", Advanced Functional Materials, vol. 20, no. 4, pp. 587-594, Feb. 2010.
    • (2010) Advanced Functional Materials , vol.20 , Issue.4 , pp. 587-594
    • Xia, Y.1    Zhang, W.2    Ha, M.3
  • 4
    • 77958002044 scopus 로고    scopus 로고
    • A 1.1V, 667MHz Random Cycle, Asymmetric 2T Gain Cell Embedded DRAM with a 99.9 Percentile Retention Time of 110μsec
    • June
    • K. Chun, P. Jain, T. Kim, et al., "A 1.1V, 667MHz Random Cycle, Asymmetric 2T Gain Cell Embedded DRAM with a 99.9 Percentile Retention Time of 110μsec", Symposium on VLSI Circuits, pp. 191-192, June 2010.
    • (2010) Symposium on VLSI Circuits , pp. 191-192
    • Chun, K.1    Jain, P.2    Kim, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.