Study of ferroelectic properties in ferroelectric/high-k dielectric bilayers

Ferroelectrics

Volumn 401, Issue 1, 2010, Pages 129-133

  Ma, Z ^a   Jiang, A Q ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

Fatigue; Ferroelectricity; PZT Al2O3 bilayers; Retention

Indexed keywords

BI-LAYER; DOMAIN SWITCHINGS; EPITAXIAL STRESS; FATIGUE; FERROELECTRIC PROPERTY; INTERFACIAL EFFECTS; K DIELECTRICS; PZT FILM; RETENTION; ULTRA-THIN;

EPITAXIAL FILMS; FERROELECTRIC MATERIALS; ULTRATHIN FILMS;

FERROELECTRICITY;

EID: 79955703138     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150191003672834     Document Type: Conference Paper

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